System on Chip Test Architectures

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  • Author : Laung-Terng Wang
  • Publisher : Morgan Kaufmann
  • Pages : 896 pages
  • ISBN : 9780080556802
  • Rating : /5 from reviews
CLICK HERE TO GET THIS BOOK >>>System on Chip Test Architectures

Download or Read online System on Chip Test Architectures full in PDF, ePub and kindle. this book written by Laung-Terng Wang and published by Morgan Kaufmann which was released on 28 July 2010 with total page 896 pages. We cannot guarantee that System on Chip Test Architectures book is available in the library, click Get Book button and read full online book in your kindle, tablet, IPAD, PC or mobile whenever and wherever You Like. Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

System on Chip Test Architectures

System on Chip Test Architectures
  • Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
  • Publisher : Morgan Kaufmann
  • Release : 28 July 2010
GET THIS BOOK System on Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

System on Chip Test Architectures

System on Chip Test Architectures
  • Author : Laung-Terng Wang,Charles Stroud,Nur Touba
  • Publisher : Unknown
  • Release : 19 October 2021
GET THIS BOOK System on Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

Introduction to Advanced System on Chip Test Design and Optimization

Introduction to Advanced System on Chip Test Design and Optimization
  • Author : Erik Larsson
  • Publisher : Springer Science & Business Media
  • Release : 30 March 2006
GET THIS BOOK Introduction to Advanced System on Chip Test Design and Optimization

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures
  • Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
  • Publisher : Elsevier
  • Release : 14 August 2006
GET THIS BOOK VLSI Test Principles and Architectures

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

VLSI SOC From Systems to Chips

VLSI SOC  From Systems to Chips
  • Author : Manfred Glesner,Ricardo Reis,Leandro Indrusiak,Vincent Mooney,Hans Eveking
  • Publisher : Springer
  • Release : 16 August 2006
GET THIS BOOK VLSI SOC From Systems to Chips

This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of Darmstadt, Germany (December 1-3, 2003). Previous conferences have taken place in Edinburgh (81), Trondheim (83), Tokyo (85), Vancouver (87), Munich (89), Edinburgh (91), Grenoble (93), Tokyo (95), Gramado (97), Lisbon (99)andMontpellier(01). The purpose of this conference, sponsored by IFIP TC 10

SOC System on a Chip Testing for Plug and Play Test Automation

SOC  System on a Chip  Testing for Plug and Play Test Automation
  • Author : Krishnendu Chakrabarty
  • Publisher : Springer Science & Business Media
  • Release : 17 April 2013
GET THIS BOOK SOC System on a Chip Testing for Plug and Play Test Automation

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and

Advances in Electronic Testing

Advances in Electronic Testing
  • Author : Dimitris Gizopoulos
  • Publisher : Springer Science & Business Media
  • Release : 22 January 2006
GET THIS BOOK Advances in Electronic Testing

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

System on Chip

System on Chip
  • Author : Bashir M. Al-Hashimi
  • Publisher : IET
  • Release : 01 January 2006
GET THIS BOOK System on Chip

System-on-Chip (SoC) represents the next major market for microelectronics, and there is considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. SoC is an expanding field, at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum which includes books, journals, and conference proceedings. The book provides a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas, provided by leading experts

VLSI SoC Advanced Topics on Systems on a Chip

VLSI SoC  Advanced Topics on Systems on a Chip
  • Author : Ricardo Reis,Vincent Mooney,Paul Hasler
  • Publisher : Springer
  • Release : 05 April 2009
GET THIS BOOK VLSI SoC Advanced Topics on Systems on a Chip

This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working

On Chip Communication Architectures

On Chip Communication Architectures
  • Author : Sudeep Pasricha,Nikil Dutt
  • Publisher : Morgan Kaufmann
  • Release : 28 July 2010
GET THIS BOOK On Chip Communication Architectures

Over the past decade, system-on-chip (SoC) designs have evolved to address the ever increasing complexity of applications, fueled by the era of digital convergence. Improvements in process technology have effectively shrunk board-level components so they can be integrated on a single chip. New on-chip communication architectures have been designed to support all inter-component communication in a SoC design. These communication architecture fabrics have a critical impact on the power consumption, performance, cost and design cycle time of modern SoC designs.

Reliability Availability and Serviceability of Networks on Chip

Reliability  Availability and Serviceability of Networks on Chip
  • Author : Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski
  • Publisher : Springer Science & Business Media
  • Release : 23 September 2011
GET THIS BOOK Reliability Availability and Serviceability of Networks on Chip

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

Design and Test Technology for Dependable Systems on chip

Design and Test Technology for Dependable Systems on chip
  • Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
  • Publisher : IGI Global
  • Release : 01 January 2011
GET THIS BOOK Design and Test Technology for Dependable Systems on chip

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Information and Business Intelligence

Information and Business Intelligence
  • Author : Xilong Qu,Chenguang Yang
  • Publisher : Springer
  • Release : 25 April 2012
GET THIS BOOK Information and Business Intelligence

This two-volume set (CCIS 267 and CCIS 268) constitutes the refereed proceedings of the International Conference on Information and Business Intelligence, IBI 2011, held in Chongqing, China, in December 2011. The 229 full papers presented were carefully reviewed and selected from 745 submissions. The papers address topics such as communication systems; accounting and agribusiness; information education and educational technology; manufacturing engineering; multimedia convergence; security and trust computing; business teaching and education; international business and marketing; economics and finance; and control systems and digital convergence.

A Practical Approach to VLSI System on Chip SoC Design

A Practical Approach to VLSI System on Chip  SoC  Design
  • Author : Veena S. Chakravarthi
  • Publisher : Springer Nature
  • Release : 25 September 2019
GET THIS BOOK A Practical Approach to VLSI System on Chip SoC Design

This book provides a comprehensive overview of the VLSI design process. It covers end-to-end system on chip (SoC) design, including design methodology, the design environment, tools, choice of design components, handoff procedures, and design infrastructure needs. The book also offers critical guidance on the latest UPF-based low power design flow issues for deep submicron SOC designs, which will prepare readers for the challenges of working at the nanotechnology scale. This practical guide will provide engineers who aspire to be VLSI