System on Chip Test Architectures

• Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
• Publisher : Morgan Kaufmann
• Release : 28 July 2010

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

• Author : Erik Larsson
• Publisher : Springer Science & Business Media
• Release : 30 March 2006

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques

• Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
• Publisher : IGI Global
• Release : 01 January 2011

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

• Author : Bashir M. Al-Hashimi
• Publisher : IET
• Release : 31 January 2006

This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.

• Author : Stephen Bo Furber
• Publisher : Pearson Education
• Release : 30 May 2023

"This book introduces the concepts and methodologies employed in designing a system-on-chip (SoC) based around a microprocessor core and in designing the microprocessor core itself. The principles of microprocessor design are made concrete by extensive illustrations based upon the ARM

• Author : Manfred Glesner,Ricardo Reis,Leandro Indrusiak,Vincent Mooney,Hans Eveking
• Publisher : Springer
• Release : 16 August 2006

This book contains extended and revised versions of the best papers that have been presented during the twelfth edition of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, a Global System-on-a-Chip Design & CAD Conference. The 12* edition was held at the Lufthansa Training Center in Seeheim-Jugenheim, south of Darmstadt, Germany (December 1-3, 2003). Previous conferences have taken place in Edinburgh (81), Trondheim (83), Tokyo (85), Vancouver (87), Munich (89), Edinburgh (91), Grenoble (93), Tokyo (95), Gramado (97), Lisbon (99)andMontpellier(01). The purpose of this conference, sponsored by IFIP TC 10

• Author : Krishnendu Chakrabarty
• Publisher : Springer Science & Business Media
• Release : 17 April 2013

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and

• Author : Dimitris Gizopoulos
• Publisher : Springer Science & Business Media
• Release : 22 January 2006

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

• Author : Ricardo Reis,Vincent Mooney,Paul Hasler
• Publisher : Springer
• Release : 05 April 2009

This book contains extended and revised versions of the best papers that were presented during the fifteenth edition of the IFIP/IEEE WG10.5 International Conference on Very Large Scale Integration, a global System-on-a-Chip Design & CAD conference. The 15th conference was held at the Georgia Institute of Technology, Atlanta, USA (October 15-17, 2007). Previous conferences have taken place in Edinburgh, Trondheim, Vancouver, Munich, Grenoble, Tokyo, Gramado, Lisbon, Montpellier, Darmstadt, Perth and Nice. The purpose of this conference, sponsored by IFIP TC 10 Working

• Author : Krishnendu Chakrabarty
• Publisher : Springer Science & Business Media
• Release : 30 September 2002

Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland,

• Author : Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski
• Publisher : Springer Science & Business Media
• Release : 23 September 2011

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

• Author : Youn-Long Steve Lin
• Publisher : Springer Science & Business Media
• Release : 31 May 2007

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.

• Author : Laung-Terng Wang,Charles Stroud,Nur Touba
• Publisher : Unknown
• Release : 30 May 2023

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

• Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
• Publisher : Elsevier
• Release : 14 August 2006

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

• Author : W. Verhaegh,Wim Verhaegh,Emile Aarts,Jan Korst
• Publisher : Springer Science & Business Media
• Release : 30 May 2023

This book is the outcome of a series of discussions at the Philips Symposium on Intelligent Algorithms, which was held in Eindhoven on December 2002. It contains many exciting and practical examples from this newly developing research field, which can be positioned at the intersection of computer science, discrete mathematics, and artificial intelligence. The examples include machine learning, content management, vision, speech, content augmentation, profiling, music retrieval, feature extraction, audio and video fingerprinting, resource management, multimedia servers, network scheduling, and IC