Scanning Nonlinear Dielectric Microscopy

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  • Author : Yasuo Cho
  • Publisher : Woodhead Publishing
  • Pages : 256 pages
  • ISBN : 0081028032
  • Rating : /5 from reviews
CLICK HERE TO GET THIS BOOK >>>Scanning Nonlinear Dielectric Microscopy

Download or Read online Scanning Nonlinear Dielectric Microscopy full in PDF, ePub and kindle. this book written by Yasuo Cho and published by Woodhead Publishing which was released on 20 May 2020 with total page 256 pages. We cannot guarantee that Scanning Nonlinear Dielectric Microscopy book is available in the library, click Get Book button and read full online book in your kindle, tablet, IPAD, PC or mobile whenever and wherever You Like. Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy
  • Author : Yasuo Cho
  • Publisher : Woodhead Publishing
  • Release : 20 May 2020
GET THIS BOOK Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has

Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials
  • Author : Marin Alexe,Alexei Gruverman
  • Publisher : Springer Science & Business Media
  • Release : 09 March 2013
GET THIS BOOK Nanoscale Characterisation of Ferroelectric Materials

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate

Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy  Characterization  Nanofabrication and Device Application of Functional Materials
  • Author : Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
  • Publisher : Springer Science & Business Media
  • Release : 30 March 2006
GET THIS BOOK Scanning Probe Microscopy Characterization Nanofabrication and Device Application of Functional Materials

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular

Roadmap of Scanning Probe Microscopy

Roadmap of Scanning Probe Microscopy
  • Author : Seizo Morita
  • Publisher : Springer Science & Business Media
  • Release : 30 December 2006
GET THIS BOOK Roadmap of Scanning Probe Microscopy

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Innovative Graphene Technologies

Innovative Graphene Technologies
  • Author : Atul Tiwari
  • Publisher : Smithers Rapra
  • Release : 02 September 2013
GET THIS BOOK Innovative Graphene Technologies

Graphene has already gained a unique reputation among novel synthetic materials. Dedicated efforts and enormous resources are being invested in creating viable commercial products. The high electrical and thermal conductivities in graphene are well known, and most of the applications of this material are pivoted to these properties. In addition to electronic and thermal management applications there are several other vital areas where graphene can be used successfully. This book is compiled in two volumes. Volume 1 is specifically meant for

Applied Scanning Probe Methods X

Applied Scanning Probe Methods X
  • Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
  • Publisher : Springer Science & Business Media
  • Release : 20 December 2007
GET THIS BOOK Applied Scanning Probe Methods X

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Polar Oxides

Polar Oxides
  • Author : Rainer Waser,Ulrich Böttger,Stephan Tiedke
  • Publisher : John Wiley & Sons
  • Release : 06 March 2006
GET THIS BOOK Polar Oxides

Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical and optical properties and microscopic investigations. Another feature is a complete profile of the properties of polar oxides -- from their proof to their latest applications. Throughout, the authors review,

Measurement Techniques for Radio Frequency Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics
  • Author : T. Mitch Wallis,Pavel Kabos
  • Publisher : Cambridge University Press
  • Release : 30 September 2017
GET THIS BOOK Measurement Techniques for Radio Frequency Nanoelectronics

Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.

Ferroelectric Random Access Memories

Ferroelectric Random Access Memories
  • Author : Hiroshi Ishiwara,Masanori Okuyama,Yoshihiro Arimoto
  • Publisher : Springer Science & Business Media
  • Release : 16 April 2004
GET THIS BOOK Ferroelectric Random Access Memories

In fabrication of FeRAMs, various academic and technological backgrounds are necessary, which include ferroelectric materials, thin film formation, device physics, circuit design, and so on.This book covers from fundamentals to applications of ferroelectric random access memories (FeRAMs). The book consists of 5 parts; (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects, and each part is further devided in several chapters. Because of the wide range of the discussed topics,

Fabrication and Characterization of Electric Field Induced Resistive Sensor at the End of Scanning Probe Tip

Fabrication and Characterization of Electric Field   Induced Resistive Sensor at the End of Scanning Probe Tip
  • Author : Anonim
  • Publisher : Unknown
  • Release : 03 December 2021
GET THIS BOOK Fabrication and Characterization of Electric Field Induced Resistive Sensor at the End of Scanning Probe Tip

Fabrication and Characterization of Electrical Field were investigated to develop induced Resistive Sensor at the end of Scanning Probe Tip. The measurement and visual observation of doping profile were performed on Kelvin Prove Force Microscopy (KPFM) & Scanning Nonlinear Dielectric Microscopy (SNDM). NiO Film was fabricated and characterized for Memory Switching applications. Last, effects of Surface Treatment on Work Function & in-plane conductivity of ITO (Indium Tin Oxide) Thin Films were also investigated.

ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis

ISTFA 2019  Proceedings of the 45th International Symposium for Testing and Failure Analysis
  • Author : Anonim
  • Publisher : ASM International
  • Release : 01 December 2019
GET THIS BOOK ISTFA 2019 Proceedings of the 45th International Symposium for Testing and Failure Analysis

The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed

Ferroelectric Thin Films

Ferroelectric Thin Films
  • Author : Masanori Okuyama,Yoshihiro Ishibashi
  • Publisher : Springer Science & Business Media
  • Release : 22 February 2005
GET THIS BOOK Ferroelectric Thin Films

Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. The contributing authors are acknowledged experts in the field.

Multifunctional Polycrystalline Ferroelectric Materials

Multifunctional Polycrystalline Ferroelectric Materials
  • Author : Lorena Pardo,Jesús Ricote
  • Publisher : Springer Science & Business Media
  • Release : 14 February 2011
GET THIS BOOK Multifunctional Polycrystalline Ferroelectric Materials

This book presents selected topics on processing and properties of ferroelectric materials that are currently the focus of attention in scientific and technical research. Ferro-piezoelectric ceramics are key materials in devices for many applications, such as automotive, healthcare and non-destructive testing. As they are polycrystalline, non-centrosymmetric materials, their piezoelectricity is induced by the so-called poling process. This is based on the principle of polarization reversal by the action of an electric field that characterizes the ferroelectric materials. This book was

ISTFA 2018 Proceedings from the 44th International Symposium for Testing and Failure Analysis

ISTFA 2018  Proceedings from the 44th International Symposium for Testing and Failure Analysis
  • Author : Anonim
  • Publisher : ASM International
  • Release : 01 December 2018
GET THIS BOOK ISTFA 2018 Proceedings from the 44th International Symposium for Testing and Failure Analysis

The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.