Reliability Robustness and Failure Mechanisms of LED Devices

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  • Author : Yannick Deshayes
  • Publisher : Elsevier
  • Pages : 172 pages
  • ISBN : 0081010885
  • Rating : /5 from reviews
CLICK HERE TO GET THIS BOOK >>>Reliability Robustness and Failure Mechanisms of LED Devices

Download or Read online Reliability Robustness and Failure Mechanisms of LED Devices full in PDF, ePub and kindle. this book written by Yannick Deshayes and published by Elsevier which was released on 27 March 2017 with total page 172 pages. We cannot guarantee that Reliability Robustness and Failure Mechanisms of LED Devices book is available in the library, click Get Book button and read full online book in your kindle, tablet, IPAD, PC or mobile whenever and wherever You Like. The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDs Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution Focuses on the method to extract fundamental parameters from electrical and optical characterizations

Reliability Robustness and Failure Mechanisms of LED Devices

Reliability  Robustness and Failure Mechanisms of LED Devices
  • Author : Yannick Deshayes,Laurent Bechou
  • Publisher : Elsevier
  • Release : 27 March 2017
GET THIS BOOK Reliability Robustness and Failure Mechanisms of LED Devices

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses

Reliability Robustness and Failure Mechanisms of Led Devices

Reliability  Robustness and Failure Mechanisms of Led Devices
  • Author : Yannick Deshayes,Laurent Bchou
  • Publisher : Iste Press - Elsevier
  • Release : 01 October 2016
GET THIS BOOK Reliability Robustness and Failure Mechanisms of Led Devices

"Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation" presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate

Reliability Investigation of LED Devices for Public Light Applications

Reliability Investigation of LED Devices for Public Light Applications
  • Author : Raphael Baillot,Yannick Deshayes
  • Publisher : Elsevier
  • Release : 09 March 2017
GET THIS BOOK Reliability Investigation of LED Devices for Public Light Applications

Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help

LED Packaging for Lighting Applications

LED Packaging for Lighting Applications
  • Author : Sheng Liu,Xiaobing Luo
  • Publisher : John Wiley & Sons
  • Release : 05 July 2011
GET THIS BOOK LED Packaging for Lighting Applications

Since the first light-emitting diode (LED) was invented by Holonyak and Bevacqua in 1962, LEDs have made remarkable progress in the past few decades with the rapid development of epitaxy growth, chip design and manufacture, packaging structure, processes, and packaging materials. LEDs have superior characteristics such as high efficiency, small size, long life, low power consumption, and high reliability. The market for white LED is growing rapidly in various applications. It has been widely accepted that white LEDs will be the

Nitride Semiconductor Light Emitting Diodes LEDs

Nitride Semiconductor Light Emitting Diodes  LEDs
  • Author : Jian-Jang Huang,Hao-Chung Kuo,Shyh-Chiang Shen
  • Publisher : Woodhead Publishing
  • Release : 24 October 2017
GET THIS BOOK Nitride Semiconductor Light Emitting Diodes LEDs

Nitride Semiconductor Light-Emitting Diodes (LEDs): Materials, Technologies, and Applications, Second Edition reviews the fabrication, performance and applications of the technology, encompassing the state-of-the-art material and device development, along with considerations regarding nitride-based LED design. This updated edition is based on the latest research and advances, including two new chapters on LEDs for large displays and laser lighting. Chapters cover molecular beam epitaxy (MBE) growth of nitride semiconductors, modern metalorganic chemical vapor deposition (MOCVD) techniques, the growth of nitride-based materials, and

Solid State Lighting Reliability Part 2

Solid State Lighting Reliability Part 2
  • Author : Willem Dirk van Driel,Xuejun Fan,Guo Qi Zhang
  • Publisher : Springer
  • Release : 13 August 2017
GET THIS BOOK Solid State Lighting Reliability Part 2

In the past four years we have witnessed rapid development in technology and significant market penetration in many applications for LED systems. New processes and new materials have been introduced; new standards and new testing methods have been developed; new driver, control and sensing technologies have been integrated; and new and unknown failure modes have also been presented. In this book, Solid State Lighting Reliability Part 2, we invited the experts from industry and academia to present the latest developments and

Solid State Lighting Reliability

Solid State Lighting Reliability
  • Author : W.D. van Driel,X.J. Fan
  • Publisher : Springer Science & Business Media
  • Release : 06 September 2012
GET THIS BOOK Solid State Lighting Reliability

Solid State Lighting Reliability: Components to Systems begins with an explanation of the major benefits of solid state lighting (SSL) when compared to conventional lighting systems including but not limited to long useful lifetimes of 50,000 (or more) hours and high efficacy. When designing effective devices that take advantage of SSL capabilities the reliability of internal components (optics, drive electronics, controls, thermal design) take on critical importance. As such a detailed discussion of reliability from performance at the device level to

Micro and Opto Electronic Materials and Structures Physics Mechanics Design Reliability Packaging

Micro  and Opto Electronic Materials and Structures  Physics  Mechanics  Design  Reliability  Packaging
  • Author : Ephraim Suhir,Y.C. Lee,C.P. Wong
  • Publisher : Springer Science & Business Media
  • Release : 26 May 2007
GET THIS BOOK Micro and Opto Electronic Materials and Structures Physics Mechanics Design Reliability Packaging

This handbook provides the most comprehensive, up-to-date and easy-to-apply information on the physics, mechanics, reliability and packaging of micro- and opto-electronic materials. It details their assemblies, structures and systems, and each chapter contains a summary of the state-of-the-art in a particular field. The book provides practical recommendations on how to apply current knowledge and technology to design and manufacture. It further describes how to operate a viable, reliable and cost-effective electronic component or photonic device, and how to make such

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
  • Author : Osamu Ueda,Stephen J. Pearton
  • Publisher : Springer Science & Business Media
  • Release : 22 September 2012
GET THIS BOOK Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices.

Electrostatic Discharge Protection

Electrostatic Discharge Protection
  • Author : Juin J. Liou
  • Publisher : CRC Press
  • Release : 19 December 2017
GET THIS BOOK Electrostatic Discharge Protection

Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip damages can be attributed to ESD events, and designing ESD structures to protect integrated circuits against the

Nitride Semiconductor Technology

Nitride Semiconductor Technology
  • Author : Fabrizio Roccaforte,Michael Leszczynski
  • Publisher : John Wiley & Sons
  • Release : 17 July 2020
GET THIS BOOK Nitride Semiconductor Technology

The book "Nitride Semiconductor Technology" provides an overview of nitride semiconductors and their uses in optoelectronics and power electronics devices. It explains the physical properties of those materials as well as their growth methods. Their applications in high electron mobility transistors, vertical power devices, LEDs, laser diodes, and vertical-cavity surface-emitting lasers are discussed in detail. The book further examines reliability issues in these materials and puts forward perspectives of integrating them with 2D materials for novel high-frequency and high-power devices.

Embedded Systems

Embedded Systems
  • Author : James K. Peckol
  • Publisher : John Wiley & Sons
  • Release : 01 April 2019
GET THIS BOOK Embedded Systems

Embedded Systems: A Contemporary Design Tool, Second Edition Embedded systems are one of the foundational elements of today’s evolving and growing computer technology. From operating our cars, managing our smart phones, cleaning our homes, or cooking our meals, the special computers we call embedded systems are quietly and unobtrusively making our lives easier, safer, and more connected. While working in increasingly challenging environments, embedded systems give us the ability to put increasing amounts of capability into ever-smaller and more