Quantitative Data Processing in Scanning Probe Microscopy

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  • Author : Petr Klapetek
  • Publisher : Elsevier
  • Pages : 416 pages
  • ISBN : 0128133481
  • Rating : /5 from reviews
CLICK HERE TO GET THIS BOOK >>>Quantitative Data Processing in Scanning Probe Microscopy

Download or Read online Quantitative Data Processing in Scanning Probe Microscopy full in PDF, ePub and kindle. this book written by Petr Klapetek and published by Elsevier which was released on 03 February 2018 with total page 416 pages. We cannot guarantee that Quantitative Data Processing in Scanning Probe Microscopy book is available in the library, click Get Book button and read full online book in your kindle, tablet, IPAD, PC or mobile whenever and wherever You Like. Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm/ Features step-by-step guidance to aid readers in progressing from a general understanding of SPM principles to a greater mastery of complex data measurement techniques Includes a focus on metrology aspects of measurements, arming readers with a solid grasp of instrumentation and measuring methods accuracy Worked examples show quantitative data processing for different SPM analytical techniques

Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy
  • Author : Petr Klapetek
  • Publisher : Elsevier
  • Release : 03 February 2018
GET THIS BOOK Quantitative Data Processing in Scanning Probe Microscopy

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more

Atomic Force Microscopy

Atomic Force Microscopy
  • Author : Bert Voigtländer
  • Publisher : Springer
  • Release : 23 May 2019
GET THIS BOOK Atomic Force Microscopy

This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic

Acoustic Scanning Probe Microscopy

Acoustic Scanning Probe Microscopy
  • Author : Francesco Marinello,Daniele Passeri,Enrico Savio
  • Publisher : Springer Science & Business Media
  • Release : 04 October 2012
GET THIS BOOK Acoustic Scanning Probe Microscopy

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration

Functional Nanomaterials and Devices for Electronics Sensors and Energy Harvesting

Functional Nanomaterials and Devices for Electronics  Sensors and Energy Harvesting
  • Author : Alexei Nazarov,Francis Balestra,Valeriya Kilchytska,Denis Flandre
  • Publisher : Springer
  • Release : 28 August 2014
GET THIS BOOK Functional Nanomaterials and Devices for Electronics Sensors and Energy Harvesting

This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is paid to fabrication and properties of modern low-power, high-performance, miniaturized, portable sensors in a wide range of applications such as telecommunications, radiation control, biomedical instrumentation and chemical analysis. In this

Atomic Force Microscopy for Energy Research

Atomic Force Microscopy for Energy Research
  • Author : Cai Shen
  • Publisher : CRC Press
  • Release : 27 April 2022
GET THIS BOOK Atomic Force Microscopy for Energy Research

Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials—such as lithium-ion batteries, solar cells, and other energy-related materials—are addressed. FEATURES First book to focus on application of AFM for energy research Details

Atomic Force Microscopy Scanning Tunneling Microscopy

Atomic Force Microscopy Scanning Tunneling Microscopy
  • Author : M.T. Bray,Samuel H. Cohen,Marcia L. Lightbody
  • Publisher : Springer Science & Business Media
  • Release : 11 November 2013
GET THIS BOOK Atomic Force Microscopy Scanning Tunneling Microscopy

The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and

Quantitative Microscopy and Image Analysis

Quantitative Microscopy and Image Analysis
  • Author : David J. Diaz
  • Publisher : Asm International
  • Release : 17 August 1994
GET THIS BOOK Quantitative Microscopy and Image Analysis

Sponsored by Materials Characterization Committee of Materials Testing and Quality Control Division ASM Publication More precise data for quality control Accurate analysis of complex images Relationship between ultrasonic and metallographic measurements Correlation between 2- and 3- dimensional distributions. Sixteen selected papers examine theories, concepts and recent advances which will help you fill the need for more precise quality control and microstructure evaluation data through automatic image analysis. Computer-aided techniques now allow you to make fast, accurate quantification of morphological features

Registration and Quantitative Image Analysis of SPM Data

Registration and Quantitative Image Analysis of SPM Data
  • Author : Anonim
  • Publisher : Unknown
  • Release : 17 August 2022
GET THIS BOOK Registration and Quantitative Image Analysis of SPM Data

Nichtlineare Verzerrungen von Rasterkraftmikroskopie (engl.: scanning probe microscopy, Abk.: SPM) Bildern beeinträchtigen die Qualität von Nanotomographiebildern und SPM Bildsequenzen. In dieser Arbeit wird ein neues, nichtlineares Registrierungsverfahren vorgestellt, das auf einem für medizinische Anwendungen entwickelten Algorithmus aufbaut und diesen für die Behandlung von SPM Daten erweitert. Die nichtlineare Registrierung ermöglicht es, verschiedene nanostrukturierte Materialen über große Bereiche (1 μm x 1 μm) mit einer Auflösung von 10 nm abzubilden. Dies erlaubt eine wesentlich detailliertere quantitative Analyse

Tantalum

Tantalum
  • Author : E. Chen,Edward S. Chen,A. Crowson,E. Lavernia,W. Ebihara,P. Kumar
  • Publisher : Tms
  • Release : 17 August 1996
GET THIS BOOK Tantalum

The 37 papers included in this proceedings volume present the state-of-the-art technology of tantalum and tantalum alloys, with an emphasis on the areas of mining, extraction, and refining; fabrication and processing; high strain rate deformation; microstructure, properties, and modeling; applications; and applications and new concepts. It is a valuable reference for scientists and engineers working in this field.