Atom Probe Tomography

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  • Author : Michael K. Miller
  • Publisher : Springer Science & Business Media
  • Pages : 239 pages
  • ISBN : 1461542812
  • Rating : /5 from reviews
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Download or Read online Atom Probe Tomography full in PDF, ePub and kindle. this book written by Michael K. Miller and published by Springer Science & Business Media which was released on 06 December 2012 with total page 239 pages. We cannot guarantee that Atom Probe Tomography book is available in the library, click Get Book button and read full online book in your kindle, tablet, IPAD, PC or mobile whenever and wherever You Like. The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

Atom Probe Tomography

Atom Probe Tomography
  • Author : Michael K. Miller
  • Publisher : Springer Science & Business Media
  • Release : 06 December 2012
GET THIS BOOK Atom Probe Tomography

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize

Atom Probe Tomography

Atom Probe Tomography
  • Author : Williams Lefebvre,Francois Vurpillot,Xavier Sauvage
  • Publisher : Academic Press
  • Release : 01 June 2016
GET THIS BOOK Atom Probe Tomography

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those

Atom Probe Tomography

Atom Probe Tomography
  • Author : Michael K. Miller,Richard G. Forbes
  • Publisher : Springer
  • Release : 31 July 2014
GET THIS BOOK Atom Probe Tomography

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new

Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography
  • Author : David J. Larson,Ty J. Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly
  • Publisher : Springer Science & Business Media
  • Release : 12 December 2013
GET THIS BOOK Local Electrode Atom Probe Tomography

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through

Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography
  • Author : David J. Larson,Ty J Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly
  • Publisher : Springer
  • Release : 07 December 2013
GET THIS BOOK Local Electrode Atom Probe Tomography

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through

Atom Probe Tomography of Hard Nitride and Boride Thin Films

Atom Probe Tomography of Hard Nitride and Boride Thin Films
  • Author : David L. J. Engberg
  • Publisher : Linköping University Electronic Press
  • Release : 02 August 2019
GET THIS BOOK Atom Probe Tomography of Hard Nitride and Boride Thin Films

Hard ceramic thin films, including TiSiN, ZrAlN, ZrB2, and ZrTaB2, with applications for wear-resistant coatings, have been studied using atom probe tomography and correlated with several other analytical techniques, including X-ray diffraction, electron microscopy, and elastic recoil detection analysis. Outstanding obstacles for quantitative atom probe tomography of ceramic thin films have been surmounted. Mass spectral overlaps in TiSiN, which make 28Si indistinguishable from 14N, was resolved by isotopic substitution with 15N, and the nanostructural distribution of elements was thus revealed

Atom Probe Microscopy

Atom Probe Microscopy
  • Author : Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer
  • Publisher : Springer Science & Business Media
  • Release : 27 August 2012
GET THIS BOOK Atom Probe Microscopy

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption