Atom Probe Tomography

• Author : Michael K. Miller
• Publisher : Springer Science & Business Media
• Release : 06 December 2012

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize

• Author : Williams Lefebvre,Francois Vurpillot,Xavier Sauvage
• Publisher : Academic Press
• Release : 30 May 2016

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining

• Author : Michael K. Miller,Richard G. Forbes
• Publisher : Springer
• Release : 31 July 2014

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new

• Author : David J. Larson,Ty J. Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly
• Publisher : Springer Science & Business Media
• Release : 12 December 2013

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through

• Author : Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer
• Publisher : Springer Science & Business Media
• Release : 27 August 2012

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption

• Author : David L. J. Engberg
• Publisher : Linköping University Electronic Press
• Release : 02 August 2019

Hard ceramic thin films, including TiSiN, ZrAlN, ZrB2, and ZrTaB2, with applications for wear-resistant coatings, have been studied using atom probe tomography and correlated with several other analytical techniques, including X-ray diffraction, electron microscopy, and elastic recoil detection analysis. Outstanding obstacles for quantitative atom probe tomography of ceramic thin films have been surmounted. Mass spectral overlaps in TiSiN, which make 28Si indistinguishable from 14N, was resolved by isotopic substitution with 15N, and the nanostructural distribution of elements was thus revealed

• Author : Michael K Miller
• Publisher : Unknown
• Release : 31 July 2000

• Author : Simon P. Ringer
• Publisher : Unknown
• Release : 23 March 2023

• Author : Anna Vallarta Ceguerra
• Publisher : Unknown
• Release : 23 March 2023

• Author : David J. Larson,Ty J. Prosa,Robert M. Ulfig
• Publisher : Unknown
• Release : 31 December 2013

• Author : Michal Dagan
• Publisher : Unknown
• Release : 23 March 2023

• Author : Thomas F. Kelly,Brian P. Gorman,Simon P. Ringer
• Publisher : Cambridge University Press
• Release : 24 March 2022

The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.

• Author : James Douglas
• Publisher : Unknown
• Release : 23 March 2023

• Author : Nan Yao,Zhong Lin Wang
• Publisher : Springer Science & Business Media
• Release : 12 July 2006

Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications

• Author : David Tweddle
• Publisher : Unknown
• Release : 23 March 2023